什么是“超聲波檢測”技術？
一般(ban)把頻率(lv)在(zai)200千赫(he)茲到25兆赫茲范(fan)圍(wei)的聲(sheng)(sheng)波(bo)叫做超聲(sheng)(sheng)波(bo)。它是(shi)一(yi)種機械(xie)振動波(bo)，它能透入物體(ti)內部(bu)并(bing)可以在(zai)物體(ti)中(zhong)傳播(bo)。利用超聲(sheng)(sheng)波(bo)在(zai)物體(ti)中(zhong)的多種傳播(bo)特(te)性，例(li)如(ru)反射(she)(she)(she)與折射(she)(she)(she)、衍射(she)(she)(she)與散射(she)(she)(she)、衰減(jian)、諧(xie)振以及聲(sheng)(sheng)速等(deng)(deng)的變化，可以測知許多物體(ti)的尺寸、表(biao)面與內部(bu)缺陷、組織變化等(deng)(deng)等(deng)(deng)，因此是(shi)應用*廣泛(fan)的一(yi)種重(zhong)要(yao)的無損檢測技術。例(li)如(ru)用于醫療上的超聲(sheng)(sheng)診斷（如(ru)B超）、海(hai)洋學中的聲納、魚(yu)群(qun)探(tan)測、海(hai)底(di)形貌探(tan)測、海(hai)洋測深、地(di)質(zhi)構造探(tan)測、工(gong)業材料及制品上(shang)的缺陷探(tan)測、硬度測量、測厚、顯(xian)微組(zu)織評(ping)價、混凝土構件檢測、陶(tao)瓷土坯的濕度測定、氣體介(jie)質(zhi)特性分析、密度測定……等(deng)等(deng)。
 
什么是“射線檢測”技術？ 
　　利用X射線、γ射線、β射(she)線(xian)(xian)以及如中子(zi)射(she)線(xian)(xian)、高能射(she)線(xian)(xian)等放射(she)線(xian)(xian)穿透物(wu)(wu)質(zhi)(zhi)時(shi)，由于(yu)存在吸收與(yu)散射(she)、電子(zi)偶生成等特性與(yu)物(wu)(wu)質(zhi)(zhi)的(de)(de)密度(du)結構相關，或(huo)(huo)者產(chan)生電離等現象，從(cong)而能夠顯(xian)示(shi)(shi)物(wu)(wu)質(zhi)(zhi)內部(bu)(bu)的(de)(de)缺陷(xian)或(huo)(huo)組織結構。常(chang)見的(de)(de)有采用(yong)照相或(huo)(huo)屏幕(mu)顯(xian)示(shi)(shi)、電視顯(xian)示(shi)(shi)等方(fang)法將物(wu)(wu)質(zhi)(zhi)內部(bu)(bu)情況顯(xian)示(shi)(shi)為可(ke)見圖(tu)像以進(jin)行(xing)分析判斷。例如工業上用(yong)于(yu)檢(jian)查鑄件(jian)、焊縫(feng)等的(de)(de)“射線照相(xiang)檢測”或(huo)“工業X光電(dian)視”、醫學界用于(yu)檢查人體(ti)的“X光透視或照相”及“CT”等(deng) 
什么是“磁粉探傷”技術？ 
　　鐵(tie)磁(ci)(ci)性(xing)(xing)材(cai)料在(zai)磁(ci)(ci)場中被磁(ci)(ci)化時，材(cai)料表(biao)(biao)(biao)面(mian)(mian)或(huo)近表(biao)(biao)(biao)面(mian)(mian)存(cun)在(zai)的缺(que)(que)陷(xian)(xian)(xian)或(huo)組織(zhi)狀態變化會使導磁(ci)(ci)率發生(sheng)(sheng)變化，即磁(ci)(ci)阻增大，使得磁(ci)(ci)路中的磁(ci)(ci)通(tong)相應發生(sheng)(sheng)畸變，除了(le)一(yi)部分磁(ci)(ci)通(tong)直接穿越缺(que)(que)陷(xian)(xian)(xian)或(huo)在(zai)材(cai)料內部繞過(guo)(guo)缺(que)(que)陷(xian)(xian)(xian)外，還有一(yi)部分磁(ci)(ci)通(tong)會離(li)開材(cai)料表(biao)(biao)(biao)面(mian)(mian)，通(tong)過(guo)(guo)空(kong)氣(qi)繞過(guo)(guo)缺(que)(que)陷(xian)(xian)(xian)再重新進(jin)入材(cai)料，從而在(zai)材(cai)料表(biao)(biao)(biao)面(mian)(mian)的缺(que)(que)陷(xian)(xian)(xian)處形成漏磁(ci)(ci)場。當采用微細的磁(ci)(ci)性(xing)(xing)介(jie)質（磁(ci)(ci)粉）鋪(pu)撒在(zai)材(cai)料表(biao)(biao)(biao)面(mian)(mian)時，這(zhe)些磁(ci)(ci)粉會被漏磁(ci)(ci)場吸附聚集從而顯示(shi)出缺(que)(que)陷(xian)(xian)(xian)所在(zai)，這(zhe)種(zhong)方法就是“磁粉(fen)探傷(shang)”技(ji)術。如果不是使(shi)用(yong)磁(ci)(ci)(ci)粉(fen)，而(er)是直(zhi)接使(shi)用(yong)特殊的(de)測(ce)(ce)磁(ci)(ci)(ci)裝置（例(li)如磁(ci)(ci)(ci)帶(dai)、檢(jian)測(ce)(ce)線圈、磁(ci)(ci)(ci)敏元件(jian)等）探查并記錄(lu)漏磁(ci)(ci)(ci)通(tong)的(de)存在(zai)來達到檢(jian)測(ce)(ce)目的(de)，則(ze)稱為“漏磁(ci)檢測(ce)”技(ji)術(shu)。目前(qian)主要應用(yong)于(yu)工業上檢查(cha)鐵(tie)磁性材(cai)料及零部件上的表(biao)面和近表(biao)面缺陷。 
什(shen)么是“滲透(tou)探傷”技(ji)術？ 
　　通過噴灑、刷涂或浸漬等方法，把滲(shen)(shen)透(tou)能(neng)力很強(qiang)的滲(shen)(shen)透(tou)液施加(jia)到(dao)被檢查的物體(ti)(ti)上，當(dang)物體(ti)(ti)表(biao)面(mian)存(cun)在(zai)開口性缺(que)陷(xian)時，滲(shen)(shen)透(tou)液因毛細管作用原理而(er)深入到(dao)缺(que)陷(xian)中去(qu)，將物體(ti)(ti)表(biao)面(mian)多余的滲(shen)(shen)透(tou)液擦拭或沖洗(xi)干(gan)凈后，再在(zai)物體(ti)(ti)表(biao)面(mian)均勻施加(jia)顯像(xiang)劑(ji)，顯像(xiang)劑(ji)能(neng)將已(yi)滲(shen)(shen)入缺(que)陷(xian)內(nei)的滲(shen)(shen)透(tou)液引導(dao)到(dao)物體(ti)(ti)表(biao)面(mian)上來，由于顯像(xiang)劑(ji)本身(shen)提供了與滲(shen)(shen)透(tou)液形成強(qiang)烈對(dui)比的背景襯托，因此(ci)反滲(shen)(shen)出的滲(shen)(shen)透(tou)液將顯示出缺(que)陷(xian)的狀況圖像(xiang)，它可以(yi)是以(yi)顏色對(dui)比而(er)在(zai)白(bai)光下用肉眼觀察（稱作“著色(se)滲透探(tan)傷(shang)”），也可以是(shi)因具有熒光作(zuo)用(yong)而在紫外(wai)光下觀(guan)察(cha)（稱作(zuo)“熒光(guang)滲透探傷(shang)”）。主(zhu)要應用于檢查材料及(ji)工(gong)件表面開(kai)口性缺陷，其(qi)靈敏度(du)(du)已經達到可(ke)以檢查出開(kai)口寬(kuan)度(du)(du)僅有微米級的缺陷。 
什么是“渦流探傷”技術？ 
基(ji)于電(dian)(dian)(dian)(dian)(dian)磁(ci)(ci)(ci)(ci)感應原理，當把通(tong)有(you)交變(bian)(bian)(bian)電(dian)(dian)(dian)(dian)(dian)流(liu)的(de)(de)線圈(quan)（激(ji)磁(ci)(ci)(ci)(ci)線圈(quan)）靠近導(dao)電(dian)(dian)(dian)(dian)(dian)物(wu)體(ti)時，線圈(quan)產(chan)生(sheng)的(de)(de)交變(bian)(bian)(bian)磁(ci)(ci)(ci)(ci)場會(hui)在(zai)導(dao)電(dian)(dian)(dian)(dian)(dian)體(ti)中(zhong)感應出渦(wo)電(dian)(dian)(dian)(dian)(dian)流(liu)，該(gai)渦(wo)電(dian)(dian)(dian)(dian)(dian)流(liu)的(de)(de)分(fen)(fen)布及大小除了與激(ji)磁(ci)(ci)(ci)(ci)條件有(you)關(guan)外，還與導(dao)電(dian)(dian)(dian)(dian)(dian)體(ti)本身的(de)(de)電(dian)(dian)(dian)(dian)(dian)導(dao)率、磁(ci)(ci)(ci)(ci)導(dao)率、導(dao)電(dian)(dian)(dian)(dian)(dian)體(ti)的(de)(de)形狀與尺寸、導(dao)電(dian)(dian)(dian)(dian)(dian)體(ti)與激(ji)磁(ci)(ci)(ci)(ci)線圈(quan)間的(de)(de)距離、導(dao)電(dian)(dian)(dian)(dian)(dian)體(ti)表(biao)面(mian)(mian)(mian)或(huo)近表(biao)面(mian)(mian)(mian)缺(que)陷的(de)(de)存在(zai)或(huo)組(zu)織變(bian)(bian)(bian)化等都有(you)密切關(guan)系。渦(wo)電(dian)(dian)(dian)(dian)(dian)流(liu)本身也(ye)要產(chan)生(sheng)交變(bian)(bian)(bian)磁(ci)(ci)(ci)(ci)場，通(tong)過檢(jian)(jian)測(ce)(ce)其交變(bian)(bian)(bian)磁(ci)(ci)(ci)(ci)場的(de)(de)變(bian)(bian)(bian)化，可以達到對(dui)導(dao)電(dian)(dian)(dian)(dian)(dian)體(ti)檢(jian)(jian)測(ce)(ce)的(de)(de)目的(de)(de)。因(yin)此，利用渦(wo)流(liu)探傷技術，可以檢(jian)(jian)測(ce)(ce)導(dao)電(dian)(dian)(dian)(dian)(dian)物(wu)體(ti)上的(de)(de)表(biao)面(mian)(mian)(mian)和近表(biao)面(mian)(mian)(mian)缺(que)陷、涂(tu)鍍層厚度、熱處(chu)理質量（如淬火透入深度、硬(ying)化層厚度、硬(ying)度等）以及材(cai)料牌號分(fen)(fen)選(xuan)等等。